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Material Science
Electron Microscopy
SEM, TEM, Particle Beam instruments and sample preparation equipment designed to set unique high quality standards and to provide customer focused solutions for the Semiconductor, Material Analysis and Life Science application fields worldwide
Surface Analysis
XPS, AES, and SIMS technologies provide our customers with unique tools to solve challenging materials problems and accelerate the development of new materials and products
Scanning Probe Microscopy
Complete range of AFM and STM solutions for imaging and measurement needs in research and industry
 
Nanotechnologies

Highly advanced modular systems for Carbon Nanotube growth expand the uses of CNTs making their integration possible for the next generation of silicon chips
 
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